ATPG for path delay faults without path enumeration

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2001-January, Issue , 2001, Pages 384-389

  Michael, M ^a   Tragoudas, S ^a  

^a SOUTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATPG METHODOLOGY; FAULT COVERAGES; FUNCTIONAL TECHNIQUE; PATH DELAY FAULT; PATH ENUMERATION; PATH SENSITIZATION; TEST PATTERN; TEST SETS;

DELAY CIRCUITS;

EID: 84949992220     PISSN: 19483287     EISSN: 19483295     Source Type: Journal    
DOI: 10.1109/ISQED.2001.915260     Document Type: Article

References (14)

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