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Thin Solid Films

Volumn 444, Issue 1-2, 2003, Pages 179-188

Oxide film growth on Fe(1 1 1) and scanning tunneling microscopy induced high electric field stress in Fe2O3/Fe(1 1 1)

(4) Qin, F a Magtoto, N P a Garza, M a Kelber, J A a

a UNIVERSITY OF NORTH TEXAS (United States)

Author keywords

Auger electron spectroscopy (AES); Field effect; Iron oxide; Scanning tunneling microscopy (STM)

Indexed keywords

ELECTRIC FIELD EFFECTS; FILM GROWTH; OXIDES; SCANNING TUNNELING MICROSCOPY;

ELECTRIC FIELD STRESS;

THIN FILMS;

EID: 0142023093 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2003.08.043 Document Type: Article

Times cited : (23)

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