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Volumn 14, Issue 17, 1998, Pages 4843-4852

Effect of interfacial sulfur on oxidation behavior and oxide adhesion to Fe(111)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ANNEALING; COMPOSITION EFFECTS; CRYSTAL STRUCTURE; FILM GROWTH; INTERFACES (MATERIALS); OXIDATION; SCANNING TUNNELING MICROSCOPY; SULFUR; THERMAL EFFECTS;

EID: 0032135933     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9709599     Document Type: Article
Times cited : (9)

References (38)
  • 6
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    • and references therein
    • Stott, F. H. Rep. Prog. Phys. 1987, 50, 861 and references therein.
    • (1987) Rep. Prog. Phys. , vol.50 , pp. 861
    • Stott, F.H.1
  • 17
    • 16444384456 scopus 로고    scopus 로고
    • Fundamental Aspects of High-Temperature Corrosion; Rapp, R. A., Hou, P. Y., Eds.; Electrochemical Society: Pennington, PA
    • Hou, P. Y.; Cannon, R. M.; Zhang H.; Williamson, R. L. In Fundamental Aspects of High-Temperature Corrosion; Rapp, R. A., Hou, P. Y., Eds.; ECS Proceedings; Electrochemical Society: Pennington, PA, 1997; Vol. 96, p 26.
    • (1997) ECS Proceedings , vol.96 , pp. 26
    • Hou, P.Y.1    Cannon, R.M.2    Zhang, H.3    Williamson, R.L.4
  • 24
    • 85088082273 scopus 로고    scopus 로고
    • note
    • 3 corresponding to the (2√3 × 1)R30°-S phase, in wich S atoms occupy surface and subsurface 3-fold sites. In the presence of O, however, determination of the S/Fe ratio is complicated, due to the attenuation of the S Auger signal by the oxide.
  • 26
    • 11744375510 scopus 로고    scopus 로고
    • Augerscan software, obtained from RBD Enterprises (Specialists in Surface Analysis, Instrumation Repair, Maintenance, and Training on Perkin-Elmer/PHI, VG, and Kratos Systems), 7685 Corporate way, Eden Prairie, MN 55344
    • Augerscan software, obtained from RBD Enterprises (Specialists in Surface Analysis, Instrumation Repair, Maintenance, and Training on Perkin-Elmer/PHI, VG, and Kratos Systems), 7685 Corporate way, Eden Prairie, MN 55344.
  • 31
    • 0010059399 scopus 로고
    • Bonzel, H. P.; Ku, R. J. Chem. Phys. 1973, 58, 4617; 1973, 59, 1641.
    • (1973) J. Chem. Phys. , vol.59 , pp. 1641
  • 38
    • 0043243210 scopus 로고
    • Omicron SPM software 2.0 Roberts Edge Enhancement is an optical computing edge detection procedure using a Roberts operator, see also: Cherri, A. K.; Karim, M. A. Appl. Opt. 1984, 28, 4644.
    • (1984) Appl. Opt. , vol.28 , pp. 4644
    • Cherri, A.K.1    Karim, M.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.