Thermal microstrains measured by atomic force microscopy

Review of Scientific Instruments

Volumn 74, Issue 7, 2003, Pages 3356-3361

  Aviles F ^a   Ceh, O ^a   Oliva, A I ^a  

^a DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; ELECTRIC CURRENTS; THERMAL EXPANSION; THIN FILMS;

THERMAL MICROSTRAINS;

METALLIC FILMS;

EID: 0043269377     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1578704     Document Type: Article

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