Electromigration in gold thin films

Thin Solid Films

Volumn 317, Issue 1-2, 1998, Pages 189-192

  Aguilar, M ^a,b   Oliva, A I ^a   Quintana, P ^a   Pena J L ^a  

^a DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Au; Electromigration; STM; Thin films; XRD

Indexed keywords

ELECTRIC CURRENTS; FILM GROWTH; GOLD; SCANNING TUNNELING MICROSCOPY; STRAIN; SURFACE STRUCTURE; SURFACE TREATMENT; THIN FILMS; X RAY DIFFRACTION;

GOLD THIN FILM; SURFACE REARRANGEMENT; SURFACE STRAIN;

ELECTROMIGRATION;

EID: 0032049890     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00515-4     Document Type: Article

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