-
1
-
-
85010099522
-
Reactive physical vapor deposition processes
-
F. R. Flory, edMarcel Dekker, New York, Chap. 4
-
H. K. Pulker and K. H. Guenther, “Reactive physical vapor deposition processes, ” in Thin Films for Optical Systems, F. R. Flory, ed. (Marcel Dekker, New York, 1995), Chap. 4, pp. 91-115.
-
(1995)
Thin Films for Optical Systems
, pp. 91-115
-
-
Pulker, H.K.1
Guenther, K.H.2
-
2
-
-
0018204673
-
The relationship between optical inhomogeneity and film structure
-
M. Harris, H. A. Macleod, S. Ogura, E. Pelletier, and B. Vidal, “The relationship between optical inhomogeneity and film structure, ” Thin Solid Films 57, 173-178 (1979).
-
(1979)
Thin Solid Films
, vol.57
, pp. 173-178
-
-
Harris, M.1
Macleod, H.A.2
Ogura, S.3
Pelletier, E.4
Vidal, B.5
-
3
-
-
0027247285
-
Dynamic characteristics in optically inhomoge-neous films
-
K. H. Guenther, ed., Proc. SPIE 1782
-
S. Ogura, “Dynamic characteristics in optically inhomoge-neous films, ” in Thin Films for Optical Systems, K. H. Guenther, ed., Proc. SPIE 1782, 377-388 (1992).
-
(1992)
Thin Films for Optical Systems
, pp. 377-388
-
-
Ogura, S.1
-
5
-
-
0020249255
-
Glassy optical coatings by multisource evaporation
-
W. R. Hunter, ed., Proc. SPIE 346
-
D. M. Sanders, E. N. Farabaugh, and W. K. Haller, “Glassy optical coatings by multisource evaporation, ” in Thin Film Technologies and Special Applications, W. R. Hunter, ed., Proc. SPIE 346, 31-38 (1982).
-
(1982)
Thin Film Technologies and Special Applications
, pp. 31-38
-
-
Sanders, D.M.1
Farabaugh, E.N.2
Haller, W.K.3
-
7
-
-
0009547489
-
Optical properties of hafnia and coevaporated hafnia:Magnesium fluoride films
-
Y. Tsou and F. C. Ho, “Optical properties of hafnia and coevaporated hafnia:magnesium fluoride films, ” Appl. Opt. 35, 5091-5094 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 5091-5094
-
-
Tsou, Y.1
Ho, F.C.2
-
8
-
-
0029542269
-
Influences of the deposition rate on the microstructure and hardness of composite films by reactive ion-assisted coevaporation
-
R.-Y. Tsai, M.-Y. Hua, and F. C. Ho, “Influences of the deposition rate on the microstructure and hardness of composite films by reactive ion-assisted coevaporation, ” Opt. Eng. 34, 3075-3082 (1995).
-
(1995)
Opt. Eng.
, vol.34
, pp. 3075-3082
-
-
Tsai, R.-Y.1
Hua, M.-Y.2
Ho, F.C.3
-
9
-
-
0027678027
-
Optical properties and environmental stability of oxide coatings deposited by reactive sputtering
-
S. M. Edlou, A. Smajkiewicz, and G. A. Al-Jumaily, “Optical properties and environmental stability of oxide coatings deposited by reactive sputtering, ” Appl. Opt. 32, 5601-5605 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 5601-5605
-
-
Edlou, S.M.1
Smajkiewicz, A.2
Al-Jumaily, G.A.3
-
10
-
-
6144250894
-
Temperature-stable bandpass filters deposited with plasma ion-assisted deposition
-
A. Zoller, R. Gotzelmann, K. Matl, and D. Cushing, “Temperature-stable bandpass filters deposited with plasma ion-assisted deposition, ” Appl. Opt. 35, 5609-5612 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 5609-5612
-
-
Zoller, A.1
Gotzelmann, R.2
Matl, K.3
Cushing, D.4
-
11
-
-
0000498601
-
Ion-beam and dual-ion-beam sputter deposition of tantalum oxide films
-
M. Cevro and G. Carter, “Ion-beam and dual-ion-beam sputter deposition of tantalum oxide films, ” Opt. Eng. 34, 596-606 (1995).
-
(1995)
Opt. Eng.
, vol.34
, pp. 596-606
-
-
Cevro, M.1
Carter, G.2
-
12
-
-
0000308188
-
Process-parameter-dependent optical and structural properties ofZrO2MgO mixed-composite films evaporated from the solid solution
-
2MgO mixed-composite films evaporated from the solid solution, ” Appl. Opt. 37, 698-718 (1998).
-
(1998)
Appl. Opt.
, vol.37
, pp. 698-718
-
-
Sahoo, N.K.1
Shapiro, A.P.2
-
13
-
-
0020114940
-
Microstructure of dielectric thin films formed by e-beam coevaporation
-
E. N. Farabaugh and D. M. Sanders, “Microstructure of dielectric thin films formed by e-beam coevaporation, ” J. Vac. Sci. Technol. A 1, 356-359 (1983).
-
(1983)
J. Vac. Sci. Technol. A
, vol.1
, pp. 356-359
-
-
Farabaugh, E.N.1
Sanders, D.M.2
-
15
-
-
0031198255
-
Characterization of yttria-stabilized zirconia thin films grown by planar magnetron sputtering
-
W.-C. Tsai and T.-Y. Tseng, “Characterization of yttria-stabilized zirconia thin films grown by planar magnetron sputtering, ” Thin Solid Films 306, 86-91 (1997).
-
(1997)
Thin Solid Films
, vol.306
, pp. 86-91
-
-
Tsai, W.-C.1
Tseng, T.-Y.2
-
16
-
-
0001157983
-
High-rate reactive sputter deposition of zirconium dioxide
-
F. Jones, “High-rate reactive sputter deposition of zirconium dioxide, ” J. Vac. Sci. Technol. A 6, 3088-3097 (1988).
-
(1988)
J. Vac. Sci. Technol. A
, vol.6
, pp. 3088-3097
-
-
Jones, F.1
-
17
-
-
0037567416
-
Influence of crystal structure on the light scatter of zirconium oxide films
-
D. Reicher and K. Jungling, “Influence of crystal structure on the light scatter of zirconium oxide films, ” Appl. Opt. 36, 1626-1637 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 1626-1637
-
-
Reicher, D.1
Jungling, K.2
-
18
-
-
0000081883
-
Growth morphology of the tetragonal phase in partially stabilized zirconia
-
R. H. J. Hannink, “Growth morphology of the tetragonal phase in partially stabilized zirconia, ” J. Mater. Sci. 13, 2487-2496 (1978).
-
(1978)
J. Mater. Sci.
, vol.13
, pp. 2487-2496
-
-
Hannink, R.H.J.1
-
19
-
-
0018466122
-
Microstructural development in MgO-stabilized zirconia (Mg-PSZ)
-
D. L. Porter and A. H. Heuer, “Microstructural development in MgO-stabilized zirconia (Mg-PSZ), ” J. Am. Ceram. Soc. 62, 298-305 (1979).
-
(1979)
J. Am. Ceram. Soc.
, vol.62
, pp. 298-305
-
-
Porter, D.L.1
Heuer, A.H.2
-
21
-
-
84980188298
-
Ceramics of highly refractory materials
-
O. Ruff and F. Ebert, “Ceramics of highly refractory materials, ” Z. Anorg. Allgem. Chem. 180, 19-41 (1929).
-
(1929)
Z. Anorg. Allgem. Chem.
, vol.180
, pp. 19-41
-
-
Ruff, O.1
Ebert, F.2
-
22
-
-
84974975324
-
Phase relationships in the system zirconia-ceria
-
P. Duwez and F. Odell, “Phase relationships in the system zirconia-ceria, ” J. Am. Ceram. Soc. 33, 274-283 (1950).
-
(1950)
J. Am. Ceram. Soc.
, vol.33
, pp. 274-283
-
-
Duwez, P.1
Odell, F.2
-
23
-
-
0030216979
-
Process-parameter optimization of Sb2O3 films in the ultraviolet and visible region for interferometric applications
-
3 films in the ultraviolet and visible region for interferometric applications, ” Appl. Phys. A 63, 195-202 (1996).
-
(1996)
Appl. Phys. A
, vol.63
, pp. 195-202
-
-
Sahoo, N.K.1
Apparao, K.V.S.R.2
-
24
-
-
0027307764
-
Computer drawing of the envelopes of spectra with interference
-
K. H. Guenther, ed., Proc. SPIE 1782
-
D. Minkov and R. Swanepoel, “Computer drawing of the envelopes of spectra with interference, ” in Thin Films for Optical Systems, K. H. Guenther, ed., Proc. SPIE 1782, 212-220 (1992).
-
(1992)
Thin Films for Optical Systems
, pp. 212-220
-
-
Minkov, D.1
Swanepoel, R.2
-
25
-
-
0000647402
-
Influence of small inhomogeneities on the spectral characteristics of single thin films
-
A. V. Tikhonravov, M. K. Trubetskov, B. T. Sullivan, and J. A. Dobrowolski, “Influence of small inhomogeneities on the spectral characteristics of single thin films, ” Appl. Opt. 36, 7188-7198 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 7188-7198
-
-
Tikhonravov, A.V.1
Trubetskov, M.K.2
Sullivan, B.T.3
Dobrowolski, J.A.4
-
26
-
-
0020204060
-
Automatic determination of the optical constants of inhomogeneous thin films
-
J. P. Borgogno, B. Lazarides, and E. Pelletier, “Automatic determination of the optical constants of inhomogeneous thin films, ” Appl. Opt. 21, 4020-4029 (1982).
-
(1982)
Appl. Opt.
, vol.21
, pp. 4020-4029
-
-
Borgogno, J.P.1
Lazarides, B.2
Pelletier, E.3
-
27
-
-
84975629130
-
Optical constants derivation for an inhomoge-neous thin film from in situ transmission measurements
-
B. Bovard, F. J. Van Milligen, M. J. Messerly, S. G. Saxe, and H. A. Macleod, “Optical constants derivation for an inhomoge-neous thin film from in situ transmission measurements, ” Appl. Opt. 24, 1803-1807 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 1803-1807
-
-
Bovard, B.1
Van Milligen, F.J.2
Messerly, M.J.3
Saxe, S.G.4
Macleod, H.A.5
-
28
-
-
21144466082
-
Observation of oxygen enrichment in zirconium oxide films
-
E. E. Khawaja, F. Bouamrane, A. B. Hallak, M. A. Daous, and M. A. Salim, “Observation of oxygen enrichment in zirconium oxide films, ” J. Vac. Sci Technol. A 11, 580-587 (1993).
-
(1993)
J. Vac. Sci Technol. A
, vol.11
, pp. 580-587
-
-
Khawaja, E.E.1
Bouamrane, F.2
Hallak, A.B.3
Daous, M.A.4
Salim, M.A.5
-
29
-
-
0000112017
-
Combination of surface characterization techniques for investigating optical thin-film components
-
A. Duparre and S. Jakobs, “Combination of surface characterization techniques for investigating optical thin-film components, ” Appl. Opt. 35, 5052-5058 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 5052-5058
-
-
Duparre, A.1
Jakobs, S.2
-
30
-
-
0030235449
-
Morphology and roughness of high-vacuum sublimed oligomer thin films
-
F. Biscarini, P. Samori, A. Lauria, P. Ostoja, R. Zamboni, C. Taliani, P. Viville, R. Lazzaroni, and J. L. Bredas, “Morphology and roughness of high-vacuum sublimed oligomer thin films, ” Thin Solid Films 284-285, 439-443 (1996).
-
(1996)
Thin Solid Films
, vol.284
, pp. 439-443
-
-
Biscarini, F.1
Samori, P.2
Lauria, A.3
Ostoja, P.4
Zamboni, R.5
Taliani, C.6
Viville, P.7
Lazzaroni, R.8
Bredas, J.L.9
-
31
-
-
85010124969
-
Pulker, Coatings on Glass, 2nd ed. (Elsevier, New York, 1984)
-
H. K. Pulker, Coatings on Glass, 2nd ed. (Elsevier, New York, 1984), Chap. 8, pp. 351.
-
Chap
, vol.8
, pp. 351
-
-
Pulker, H.K.1
-
32
-
-
0000621652
-
The structure of evaporated metal films and their optical properties
-
R. S. Sennett and G. D. Scott, “The structure of evaporated metal films and their optical properties, ” J. Opt. Soc. Am. 40, 203-211 (1950).
-
(1950)
J. Opt. Soc. Am.
, vol.40
, pp. 203-211
-
-
Sennett, R.S.1
Scott, G.D.2
|