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Volumn 35, Issue 25, 1996, Pages 5091-5094

Optical properties of hafnia and coevaporated hafnia:magnesium fluoride thin films

Author keywords

Composite film; HfO2; Ion assisted deposition; MgF2

Indexed keywords


EID: 0009547489     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.005091     Document Type: Article
Times cited : (27)

References (7)
  • 1
    • 0028736451 scopus 로고
    • Characterization of composite TiO2-MgF2 films prepared by reactive ion-assisted coevaporation
    • 2 films prepared by reactive ion-assisted coevaporation, ” Opt. Eng. 33, 3411-3418 (1994).
    • (1994) Opt. Eng. , vol.33 , pp. 3411-3418
    • Tsai, R.-Y.1    Hua, M.-Y.2    Wei, C.-T.3    Ho, F.C.4
  • 2
    • 0009968458 scopus 로고
    • Inhomogeneous and coevaporated homogeneous films for optical applications
    • R. Jacobsson, “Inhomogeneous and coevaporated homogeneous films for optical applications, ” Phys. Thin Films 8, 51-98 (1975).
    • (1975) Phys. Thin Films , vol.8 , pp. 51-98
    • Jacobsson, R.1
  • 3
    • 0027678027 scopus 로고
    • Optical properties and environmental stability of oxide coatings deposited by reactive sputtering
    • S. M. Edlou, A. Smajkiewicz, and G. A. Al-Jumaily, “Optical properties and environmental stability of oxide coatings deposited by reactive sputtering, ” Appl. Opt. 32, 5601-5605 (1993).
    • (1993) Appl. Opt. , vol.32 , pp. 5601-5605
    • Edlou, S.M.1    Smajkiewicz, A.2    Al-Jumaily, G.A.3
  • 4
    • 0017243777 scopus 로고
    • Electron microscopic investigations of cross sections of optical thin films
    • K. H. Guenther and H. K. Pulker, “Electron microscopic investigations of cross sections of optical thin films, ” Appl. Opt. 15, 1992-2997 (1976).
    • (1976) Appl. Opt. , vol.15 , pp. 1992-2997
    • Guenther, K.H.1    Pulker, H.K.2
  • 5
    • 84975016505 scopus 로고
    • Use of ion beam assisted deposition to modify the microstructure and properties ofthin films
    • F. A. Smidt, “Use of ion beam assisted deposition to modify the microstructure and properties ofthin films, ” Int. Mater. Rev. 35, 61-128 (1990).
    • (1990) Int. Mater. Rev. , vol.35 , pp. 61-128
    • Smidt, F.A.1
  • 6
    • 0020940620 scopus 로고
    • Determination of the thickness and optical constants of amorphous silican
    • R. Swanepoel, “Determination of the thickness and optical constants of amorphous silican, ” J. Phys. E 16, 1214-1222 (1983).
    • (1983) J. Phys. E , vol.16 , pp. 1214-1222
    • Swanepoel, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.