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Volumn 174-175, Issue , 2003, Pages 1121-1125

The constitution and properties of cubic boron nitride thin films: A comparative study on the influence of bombarding ion energy

Author keywords

Cubic boron nitride; Electron energy loss spectroscopy; R.f. sputtering; Stress

Indexed keywords

COMPRESSIVE STRESS; ELECTRON ENERGY LOSS SPECTROSCOPY; INFRARED SPECTROSCOPY; ION BOMBARDMENT; MAGNETRON SPUTTERING; NUCLEATION; THIN FILMS;

EID: 0042854697     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(03)00533-4     Document Type: Article
Times cited : (19)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.