PROPTEST: A property-based test generator for synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 22, Issue 8, 2003, Pages 1080-1091

  Guo, Ruifeng ^a   Reddy, Sudhakar M ^b   Pomeranz, Irith ^c  

^a INTEL CORPORATION   (United States)

^b UNIVERSITY OF IOWA   (United States)

^c PURDUE UNIVERSITY   (United States)

Author keywords

Automatic test pattern generation (ATPG); Sequential circuit; Test compaction; Test generation

Indexed keywords

AUTOMATIC TESTING; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; ELECTRONIC EQUIPMENT TESTING; VECTORS;

PROPERTY-BASED TEST GENERATORS;

SEQUENTIAL CIRCUITS;

EID: 0042593196     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2003.814953     Document Type: Conference Paper

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