Vector restoration based static compaction of test sequences for synchronous sequential circuits

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 1997, Pages 360-365

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; SEQUENTIAL CIRCUITS; VECTORS;

STATIC COMPACTION; SYNCHRONOUS SEQUENTIAL CIRCUITS; VECTOR RESTORATION;

INTEGRATED CIRCUIT TESTING;

EID: 0031353137     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)