메뉴 건너뛰기




Volumn 82, Issue 26, 2003, Pages 4708-4710

Structural and electrical characteristics of Ge nanoclusters embedded in Al2O3 gate dielectric

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANNEALING; CAPACITANCE; DIELECTRIC MATERIALS; DIFFUSION; GATES (TRANSISTOR); HYSTERESIS;

EID: 0042347535     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1588373     Document Type: Article
Times cited : (69)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.