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Volumn 94, Issue 1, 2003, Pages 633-637

Room temperature nanocrystalline silicon single-electron transistors

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRODES; GRAIN BOUNDARIES; NANOSTRUCTURED MATERIALS; OXIDATION; POINT CONTACTS; POTENTIAL ENERGY; SILICON; THIN FILMS;

EID: 0042341673     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1569994     Document Type: Article
Times cited : (95)

References (22)
  • 4
    • 0003285520 scopus 로고
    • Single charge tunneling, coulomb blockade phenomena in nanostructures
    • Plenum, New York
    • H. Grabert and M. H. Devoret, Single Charge Tunneling, Coulomb Blockade Phenomena in Nanostructures, NATO ASI Series B Vol. 294 (Plenum, New York, 1992).
    • (1992) NATO ASI Series B , vol.294
    • Grabert, H.1    Devoret, M.H.2
  • 15
  • 18
    • 0041356596 scopus 로고    scopus 로고
    • Polycryslalline Semiconductors VII-Bulk Materials, Thin Films, and Devices, edited by T. Sameshima, T. Fuyuki, H. P. Strunk, and J. H. Werner (Scitech, Uettikon am See, Switzerland (to be published)
    • H. Mizuta, Y. Furuta, T. Kamiya, Y. T. Tan, Z. A. K. Durrani, and K. Nakazato, in Polycryslalline Semiconductors VII-Bulk Materials, Thin Films, and Devices, Solid State Phenomena Series, edited by T. Sameshima, T. Fuyuki, H. P. Strunk, and J. H. Werner (Scitech, Uettikon am See, Switzerland (to be published).
    • Solid State Phenomena Series
    • Mizuta, H.1    Furuta, Y.2    Kamiya, T.3    Tan, Y.T.4    Durrani, Z.A.K.5    Nakazato, K.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.