A scan BIST generation method using a Markov source and partial bit-fixing

Proceedings - Design Automation Conference

Volumn , Issue , 2003, Pages 554-559

  Li, Wei ^a   Yu, Chaowen ^a   Reddy, Sudhakar M ^a   Pomeranz, Irith ^b  

^a UNIVERSITY OF IOWA   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

BIST; Markov; Testing

Indexed keywords

BIT ERROR RATE; DATA TRANSFER; MARKOV PROCESSES; PATTERN MATCHING; PROBABILITY;

PARTIAL BIT FIXING;

DIGITAL SIGNAL PROCESSING;

EID: 0042134723     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775972.775974     Document Type: Conference Paper

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