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Volumn 11, Issue 3, 2003, Pages 336-344

On-chip oscilloscopes for noninvasive time-domain measurement of waveforms in digital integrated circuits

Author keywords

Inductance modeling; Mixed signal test; Subsampling

Indexed keywords

ANALOG TO DIGITAL CONVERSION; BUILT-IN SELF TEST; COMPUTER SIMULATION; DIGITAL INTEGRATED CIRCUITS; FREQUENCIES; INDUCTANCE; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; SAMPLING; TIME DOMAIN ANALYSIS;

EID: 0041919508     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2003.812313     Document Type: Article
Times cited : (58)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.