Improving the testability of mixed-signal integrated circuits

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1997, Pages 214-221

  Roberts, Gordon W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; INTEGRATED CIRCUIT MANUFACTURE; QUALITY ASSURANCE;

MIXED SIGNAL INTEGRATED CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0030655538     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)