Applications of on-chip samplers for test and measurement of integrated circuits

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 1998, Pages 138-139

  Ho, Ron ^a   Amrutur, Bharadwaj ^a   Mai, Ken ^a   Wilburn, Bennett ^a   Mori, Toshihiko ^a   Horowitz, Mark ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; RANDOM ACCESS STORAGE; TIMING CIRCUITS;

STATIC RANDOM ACCESS MEMORY (SRAM);

VLSI CIRCUITS;

EID: 0031621399     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)