메뉴 건너뛰기





Volumn , Issue , 1998, Pages 138-139

Applications of on-chip samplers for test and measurement of integrated circuits

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; RANDOM ACCESS STORAGE; TIMING CIRCUITS;

EID: 0031621399     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (68)

References (2)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.