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Volumn , Issue , 1998, Pages 138-139
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Applications of on-chip samplers for test and measurement of integrated circuits
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
BANDWIDTH;
INTEGRATED CIRCUIT TESTING;
MICROPROCESSOR CHIPS;
RANDOM ACCESS STORAGE;
TIMING CIRCUITS;
STATIC RANDOM ACCESS MEMORY (SRAM);
VLSI CIRCUITS;
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EID: 0031621399
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (68)
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References (2)
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