Static leakage reduction through simultaneous threshold voltage and state assignment

Proceedings - Design Automation Conference

Volumn , Issue , 2003, Pages 191-194

  Lee, Dongwoo ^a   Blaauw, David ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Algorithms; Design; Performance; Reliability

Indexed keywords

ALGORITHMS; DELAY CIRCUITS; LEAKAGE CURRENTS; OPTIMIZATION; THRESHOLD VOLTAGE; TRANSISTORS;

STATIC LEAKAGE REDUCTION;

LOGIC CIRCUITS;

EID: 0042635859     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775832.775881     Document Type: Conference Paper

References (8)

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