Point defect distributions and their electrical effects on (Ba,Sr)TiO 3/Pt thin films

Journal of Applied Physics

Volumn 94, Issue 3, 2003, Pages 1926-1933

  Wang, Ruey Ven ^a   McIntyre, Paul C ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEUTERIUM; LEAKAGE CURRENTS; POINT DEFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

BAND BENDING;

THIN FILMS;

EID: 0041510162     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1590063     Document Type: Article

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