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Volumn 94, Issue 4, 2003, Pages 2749-2751

Statistical model for prebreakdown current jumps and breakdown caused by single traps in magnetic tunnel junctions

a IMEC (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; DEGRADATION; MATHEMATICAL MODELS; OXIDATION; ULTRAVIOLET RADIATION;

MAGNETIC TUNNEL JUNCTIONS (MTJ);

TUNNEL JUNCTIONS;

EID: 0041421149 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1592300 Document Type: Article

Times cited : (15)

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