Ballistic electron microscopy study of ultrathin oxidized aluminum barriers for magnetic tunnel junctions

Applied Physics Letters

Volumn 78, Issue 11, 2001, Pages 1601-1603

  Rippard, W H ^a   Perrella, A C ^a   Buhrman, R A ^a  

^a Department of Materials Science and Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035848183     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1352045     Document Type: Article

References (13)

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