Bonding modifications in carbon nitride films induced by thermal annealing: An x-ray absorption near edge study

Applied Physics Letters

Volumn 74, Issue 18, 1999, Pages 2620-2622

  Jimenez I ^a   Tong, W M ^b,c   Shuh, D K ^b   Holloway, B C ^c,f   Kelly, M A ^c   Pianetta, P ^c   Terminello, L J ^d   Himpsel, F J ^e  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c STANFORD UNIVERSITY   (United States)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^e University of Wisconsin Madison   (United States)

^f The College of William and Mary   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040706842     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123916     Document Type: Article

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