Structural development of silicated films self-assembled at the air-water interface

Physica B: Condensed Matter

Volumn 336, Issue 1-2, 2003, Pages 193-203

  Holt, S A ^a,b   Ruggles, J L ^a,c   Reynolds, P A ^a   White, J W ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

Grazing incidence diffraction; Reflectometry; Self assembly

Indexed keywords

FILM GROWTH; NEUTRON REFLECTION; PHASE INTERFACES; SELF ASSEMBLY; SILICATES; X RAY DIFFRACTION;

MESOPOROUS FILMS;

MESOPOROUS MATERIALS;

EID: 0038683271     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(03)00289-8     Document Type: Conference Paper

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