Observation of hexagonal crystalline diffraction from growing silicate films

Langmuir

Volumn 15, Issue 7, 1999, Pages 2540-2542

  Holt, Stephen A ^a   Foran, Garry J ^b,c   White, John W ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; FILM GROWTH; PHASE INTERFACES; SYNCHROTRON RADIATION; X RAY CRYSTALLOGRAPHY;

GRAZING INCIDENCE X-RAY DIFFRACTION (GIXD) ANALYSIS;

SILICATES;

EID: 0344672462     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la981390u     Document Type: Article

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