In situ Brewster angle microscopy and surface pressure studies on the interfacial growth of mesostructured silica thin films

Chemical Communications

Volumn , Issue 9, 2000, Pages 773-774

  Edler, Karen J ^b   Roser, Steve J ^b   Mann, Stephen ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

INORGANIC COMPOUND; SILICON DIOXIDE; SURFACTANT;

ARTICLE; FILM; FILTRATION; MICROSCOPY; REFLECTOMETRY; REPRODUCIBILITY; SYNTHESIS; X RAY ANALYSIS;

EID: 0034616530     PISSN: 13597345     EISSN: None     Source Type: Journal    
DOI: 10.1039/b000375l     Document Type: Article

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