Mesoporous silicate film growth at the air-water interface-direct observation by x-ray reflectivity

Langmuir

Volumn 13, Issue 24, 1997, Pages 6363-6365

  Brown, A S ^a   Holt, S A ^a   Dam, Thien ^b   Trau, M ^b   White, J W ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; FILM GROWTH; MOLECULAR STRUCTURE; PHASE INTERFACES; POROUS MATERIALS; SURFACE ACTIVE AGENTS;

X RAY REFLECTIVITY;

SILICATES;

EID: 0031268277     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970832j     Document Type: Article

References (7)

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4. Penfold, J. In Neutron, X-ray and Light Scattering; Lidner, P., Zemb, Th., Eds.; Elsevier: Amsterdam, 1991; p 223.
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6. Born, M.; Wolf, E. Principles of Optics. Electromagnetic Theory of Propagation, Interference and Diffraction of Light, 4th ed.; Springer: Berlin, 1970.
7. James, R. W. The Optical Principles of The Diffraction of X-Rays. In The Crystalline State; Bragg, L., Ed.; G. Bell and Sons LTD: London, 1965; Vol. 2, p 38.