Application of imaging-grazing-incidence X-ray diffraction and specular reflectivity to the structural investigation of quantum-confinement semiconductor devices

Journal of Synchrotron Radiation

Volumn 4, Issue 3, 1997, Pages 169-174

  Holt, S A ^a   Brown, A S ^b   Creagh, D C ^c   Leon, R ^b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^c UNIVERSITY OF CANBERRA   (Australia)

Author keywords

Imaging grazing incidence X ray diffraction; Interfaces; Quantum dots; Quantum wells; X ray reflectivity

Indexed keywords

EID: 0031503203     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597004123     Document Type: Article

References (7)

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6. Leon, R., Krueger, J., Melloch, M., Bozek, R., Wysmolek, A., Kurpiewski, A. & Kaminska, M. (1997). In preparation.
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