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Volumn 14, Issue 19, 1998, Pages 5532-5538

Growth of highly ordered thin silicate films at the air-water interface

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIUM COMPOUNDS; CRYSTAL ORIENTATION; CRYSTALLIZATION; FILM GROWTH; MOLECULAR STRUCTURE; NEGATIVE IONS; NEUTRON REFLECTION; PHASE INTERFACES; SILICATES; THIN FILMS; X RAY ANALYSIS;

EID: 0032166458     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980485t     Document Type: Article
Times cited : (63)

References (22)
  • 13
    • 11644297352 scopus 로고    scopus 로고
    • Research School of Chemistry, Australian National University, January
    • McGilvray, D. Vacation Scholarship Report, Research School of Chemistry, Australian National University, January 1998.
    • (1998) Vacation Scholarship Report
    • McGilvray, D.1
  • 22
    • 11644253968 scopus 로고    scopus 로고
    • Ruggles, J. L., 1998
    • Ruggles, J. L., 1998.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.