DC and pulsed measurements of on-state breakdown voltage in GaAs MESFETs and InP-based HEMTs

Microelectronics Reliability

Volumn 39, Issue 12, 1999, Pages 1759-1763

  Meneghesso, Gaudenzio ^a   Massari, Giovanni ^a   Buttari, Dario ^a   Bortoletto, Andrea ^a   Maretto, Massimo ^a   Zanoni, Enrico ^a  

^a UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038506819     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00182-1     Document Type: Article

References (18)

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