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Volumn 150, Issue 7, 2003, Pages

Electrochemical characterization of carbon films with porous microstructures

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CYCLIC VOLTAMMETRY; ELECTROCHEMICAL ELECTRODES; POROSITY; POROUS MATERIALS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACE STRUCTURE; THIN FILMS; VAPOR DEPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0038445641     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1579484     Document Type: Article
Times cited : (33)

References (45)
  • 2
    • 0004175336 scopus 로고
    • A. J. Bard, Editor; Marcel Dekker, New York
    • R. L. McCreery, in Electroanalytical Chemistry, A. J. Bard, Editor, Vol. 17, Marcel Dekker, New York (1991).
    • (1991) Electroanalytical Chemistry , vol.17
    • McCreery, R.L.1
  • 14
    • 0037828858 scopus 로고    scopus 로고
    • U.S. Pat. no. 5,866,204
    • K. Robbie and M. J. Brett, U.S. Pat. no. 5,866,204 (1999).
    • (1999)
    • Robbie, K.1    Brett, M.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.