Systematic test program generation for SoC testing using embedded processor

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 5, Issue , 2003, Pages

  Tehranipour, M H ^a   Nourani, M ^a   Fakhraie, S M ^b   Afzali Kusha, A ^b  

^a UNIVERSITY OF TEXAS AT DALLAS   (United States)

^b UNIVERSITY OF TEHRAN   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; COMPUTER SOFTWARE; EMBEDDED SYSTEMS;

EMBEDDED PROCESSORS;

PROGRAM PROCESSORS;

EID: 0038420014     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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