Moving current filaments in ESD protection devices and their relation to electrical characteristics

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2003, Pages 241-248

  Pogany, D ^a   Bychikhin, S ^a   Gornik, E ^a   Denison, M ^b   Jensen, N ^b   Groos, G ^b,c   Stecher, M ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b INFINEON TECHNOLOGIES AG   (Germany)

^c BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

Current filament; Electrothermal effects; ESD phenomena; Semiconductor device testing; Thermal mapping; Transmission line pulser

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC EQUIPMENT PROTECTION; ELECTRIC LINES; ELECTRIC POTENTIAL; SEMICONDUCTOR DEVICE TESTING; STEADY FLOW; THERMOANALYSIS;

THERMAL MAPPING;

ELECTRIC DISCHARGES;

EID: 0038310080     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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