Low-frequency noise in n-channel metal-oxide-semiconductor field-effect transistors undergoing soft breakdown

Journal of Applied Physics

Volumn 89, Issue 1, 2001, Pages 648-653

  Chen, Ming Jer ^a   Kang, Ting Kuo ^a   Lee, Yuan Hwa ^a   Liu, Chuan Hsi ^b   Chang, Yih J ^b   Fu, Kuan Yu ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b UNITED MICROELECTRONICS CORPORATION   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038103667     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1333029     Document Type: Article

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