Non-Gaussian behavior and anticorrelations in ultrathin gate oxides after soft breakdown

Applied Physics Letters

Volumn 74, Issue 11, 1999, Pages 1579-1581

  Vandewalle, N ^a   Ausloos, M ^a   Houssa, M ^b   Mertens, P W ^b   Heyns, M M ^b  

^a UNIVERSITY OF LIÈGE   (Belgium)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000402688     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123622     Document Type: Article

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