Soft breakdown fluctuation events in ultrathin SiO2 layers

Applied Physics Letters

Volumn 73, Issue 4, 1998, Pages 490-492

  Miranda, E ^a   Sune J ^a   Rodriguez R ^a   Nafria M ^a   Aymerich, X ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000209222     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121910     Document Type: Article

References (18)

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