Scanning tunneling microscope with continuous flow cryostat sample cooling

Review of Scientific Instruments

Volumn 68, Issue 6, 1997, Pages 2479-2485

  Behler, Stefan ^a,c   Rose, Mark K ^a   Dunphy, James C ^a   Ogletree, D Frank ^a   Salmeron, Miquel ^a   Chapelier, Claude ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b CEA GRENOBLE   (France)

^c Oerlikon Assembly Equipment AG   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000232218     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148172     Document Type: Article

References (41)

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