Microwave reflectance studies of photoelectrochemical kinetics at semiconductor electrodes. 1. Steady-state, transient, and periodic responses

Journal of Physical Chemistry B

Volumn 107, Issue 24, 2003, Pages 5857-5863

  Cass, Michael J ^a   Duffy, Noel W ^b   Peter, Laurence M ^b   Pennock, Stephen R ^c   Ushiroda, Shin ^b   Walker, Alison B ^a  

^a University of Bath   (United Kingdom)

^b University of Bath   (United Kingdom)

^c University of Bath   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLYTES; ELECTRON TRANSPORT PROPERTIES; INTERFACES (MATERIALS); MICROWAVES; NUMERICAL METHODS; PHOTOCHEMICAL REACTIONS; PHOTOCURRENTS; RATE CONSTANTS; REFLECTION; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING;

MICROWAVE REFLECTANCE; PHOTOELECTROCHEMICAL KINETICS; SEMICONDUCTOR ELECTRODES; STEADY STATE MICROWAVE RESPONSE;

ELECTRODES;

EID: 0037900470     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp030088d     Document Type: Article

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