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Volumn 443, Issue 1, 1998, Pages 9-31

Photocurrent and excess microwave reflectivity at semiconductor|electrolyte junctions I. Minority carrier profiles

Author keywords

Microwave reflectivity; Photocurrent; Semiconductor|electrolyte junctions

Indexed keywords

CALCULATIONS; CHARGE TRANSFER; CURRENT DENSITY; ELECTRIC CURRENTS; ELECTROLYTES; LIGHT; MATHEMATICAL MODELS; MICROWAVE MEASUREMENT; MICROWAVES; SEMICONDUCTING SILICON; SURFACES;

EID: 0032003304     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(97)00289-1     Document Type: Article
Times cited : (9)

References (29)
  • 9
    • 26344460399 scopus 로고
    • PhD Thesis, Freie Universität Berlin
    • G. Schlichthörl, PhD Thesis, Freie Universität Berlin, 1991.
    • (1991)
    • Schlichthörl, G.1
  • 24


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.