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Volumn 443, Issue 1, 1998, Pages 9-31
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Photocurrent and excess microwave reflectivity at semiconductor|electrolyte junctions I. Minority carrier profiles
a a |
Author keywords
Microwave reflectivity; Photocurrent; Semiconductor|electrolyte junctions
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Indexed keywords
CALCULATIONS;
CHARGE TRANSFER;
CURRENT DENSITY;
ELECTRIC CURRENTS;
ELECTROLYTES;
LIGHT;
MATHEMATICAL MODELS;
MICROWAVE MEASUREMENT;
MICROWAVES;
SEMICONDUCTING SILICON;
SURFACES;
MICROWAVE REFLECTIVITY;
PHOTOCURRENT;
SURFACE RECOMBINATION;
INTERFACES (MATERIALS);
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EID: 0032003304
PISSN: 15726657
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0728(97)00289-1 Document Type: Article |
Times cited : (9)
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References (29)
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