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Volumn 22, Issue 6, 2003, Pages 742-747

Mixed-mode simulation approach to characterize the circuit delay sensitivity to implant dose variations

Author keywords

Circuit delay; CMOS technology; Disposable spacer; Mixed mode simulation; Sensitivity analysis

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; GATES (TRANSISTOR); OPTIMIZATION; SENSITIVITY ANALYSIS; THIN FILM TRANSISTORS;

EID: 0037704235     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2003.811453     Document Type: Conference Paper
Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.