|
Volumn 42, Issue 5 A, 2003, Pages 2592-2599
|
Structural properties of nickel metal-induced laterally crystallized silicon films and their improvement using excimer laser annealing
a a b b c d |
Author keywords
Annealing; Crystallization; Excimer; Grai n; Growth; Laser; Moir ; Nickel; Orientation; Polycrystalline; Silicon
|
Indexed keywords
ANNEALING;
CRYSTAL GROWTH;
CRYSTALLIZATION;
EXCIMER LASERS;
POLYCRYSTALLINE MATERIALS;
LASER ANNEALING;
SEMICONDUCTING FILMS;
|
EID: 0037697369
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.42.2592 Document Type: Article |
Times cited : (17)
|
References (23)
|