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Volumn 42, Issue 4 A, 2003, Pages 1738-1743
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Structural analysis of anatase polycrystalline films using time-dependent deformation behavior
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Author keywords
Anatase; Creep; CVD; Film; Grain boundary; Hardness; Nanoindentation; Polycrystal
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Indexed keywords
ATMOSPHERIC PRESSURE;
CHEMICAL VAPOR DEPOSITION;
CREEP;
DEFORMATION;
GRAIN BOUNDARIES;
MICROSTRUCTURE;
MORPHOLOGY;
STRAIN RATE;
SUBSTRATES;
SURFACE STRUCTURE;
THERMOCOUPLES;
THIN FILMS;
NANOINDENTATION TECHNIQUE;
NANOINDENTER;
POLYCRYSTALLINE FILM;
POWER-LAW MODEL;
TIME-DEPENDENT DEFORMATION;
POLYCRYSTALLINE MATERIALS;
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EID: 0037594077
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.42.1738 Document Type: Article |
Times cited : (3)
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References (9)
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