Homogeneous growth of zinc oxide whiskers

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 12 A, 1999, Pages 6873-6877

  Saitoh, Hidetoshi ^a   Satoh, Minoru ^a   Tanaka, Norio ^a   Ueda, Yoshikazu ^b   Ohshio, Shigeo ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b ASAHI CHEMICAL INDUSTRY CO   (Japan)

Author keywords

CVD; Epitaxy; Orientation; Sapphire; SEM; Whisker; X ray diffraction; ZnO

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; CRYSTAL ORIENTATION; CRYSTAL WHISKERS; EPITAXIAL GROWTH; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; X RAY CRYSTALLOGRAPHY; ZINC OXIDE;

HOMOGENEOUS GROWTH; VAPORIZING TEMPERATURE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0033343040     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.6873     Document Type: Article

References (2)

1. M. Kawasaki, A. Ohtomo, H. Koinuma, Y. Sakurai, Z. K. Tang, P. Yu, G. L. K. Wong and Y. Segawa: Mater. Sci. Forum 264-268 (1998) 1459.
2. M. Kitano, T. Hamabe, S. Macda and T. Okabe: J. Cryst. Growth 102 (1990) 956.