Dependence of the tip-surface interaction on the surface electronic structure

Applied Surface Science

Volumn 210, Issue 1-2 SPEC., 2003, Pages 146-152

  Foster, A S ^a   Gal, A Y ^b   Lee, Y J ^a   Shluger, A L ^b   Nieminen, R M ^a  

^a AALTO UNIVERSITY   (Finland)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

Electronic structure; Si; Tip surface

Indexed keywords

ATOMIC FORCE MICROSCOPY; BAND STRUCTURE; CARRIER CONCENTRATION; CHARGE TRANSFER; COMPUTER SIMULATION; ELECTRIC FIELDS; ELECTRONIC STRUCTURE; ELECTROSTATICS; SILICON;

TIP-SURFACE INTERACTIONS;

SURFACE STRUCTURE;

EID: 0037474585     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01495-2     Document Type: Conference Paper

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