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Volumn 501, Issue 1, 2003, Pages 146-152

Charge collection efficiency studies with irradiated silicon detectors

Author keywords

Detectors; Particle physics; Radiation; Silicon

Indexed keywords

BANDWIDTH; HIGH ENERGY PHYSICS; IONIZING RADIATION; MICROSTRIP DEVICES; PROTONS; SILICON;

EID: 0037459625     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)02024-7     Document Type: Conference Paper
Times cited : (9)

References (37)
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  • 7
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  • 9
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    • Augelli, V.1
  • 17
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    • Micron Semiconductor Ltd, 1 Royal Buildings, Marlborough Road, Lancing, Sussex BN15 8UN, UK
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  • 22
    • 0344403245 scopus 로고    scopus 로고
    • Ph.D. Thesis, Universit J. Fourier, Grenoble
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    • Ph.D. Thesis, The University of Liverpool
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.