Efficiency and noise measurements of non-uniformly irradiated double-sided silicon strip detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 383, Issue 1, 1996, Pages 174-178

  Dubbs, T ^a   Kashigin, S ^a   Kratzer, M ^a   Kroeger, W ^a   Pulliam, T ^a   Sadrozinski, H F W ^a   Schwab, M ^a   Spencer, E ^a   Wichmann, R ^a   Wilder, M ^a   Unno, Y ^b   Ohsugi, T ^c  

^a UNIVERSITY OF CALIFORNIA SANTA CRUZ   (United States)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^c HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; IRRADIATION; MICROSTRIP DEVICES; PROTONS; RADIATION EFFECTS; READOUT SYSTEMS; SIGNAL NOISE MEASUREMENT; SILICON SENSORS; VOLTAGE MEASUREMENT;

BINARY READOUT SYSTEMS; PROTON IRRADIATION; SILICON MICROSTRIP DETECTORS;

PARTICLE DETECTORS;

EID: 0030383813     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00749-8     Document Type: Article

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