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Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 309, Issue 1-2, 2003, Pages 133-137

Analytical solution of flexural vibration responses on taped atomic force microscope cantilevers

(2) Chang, Win Jin a Chu, Shao Shu a

a KUN SHAN UNIVERSITY (Taiwan)

Author keywords

AFM cantilever; Flexural vibration; Taped cross section

Indexed keywords

NANOCANTILEVERS; NATURAL FREQUENCIES;

AFM CANTILEVERS; ARBITRARY DIMENSION; ATOMIC FORCE MICROSCOPE CANTILEVERS; CIRCULAR AND RECTANGULAR CROSS-SECTION; CLOSED-FORM EXPRESSION; FLEXURAL VIBRATIONS; RESONANCE FREQUENCIES; TAPED CROSS-SECTION;

VIBRATION ANALYSIS;

ACCURACY; ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE RECONSTRUCTION; MATHEMATICAL ANALYSIS; SOLID STATE; STRUCTURE ANALYSIS; VIBRATION;

EID: 0037451025 PISSN: 03759601 EISSN: None Source Type: Journal
DOI: 10.1016/S0375-9601(03)00129-4 Document Type: Article

Times cited : (30)

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