Sensitivity of vibration modes of atomic force microscope cantilevers in continuous surface contact

Nanotechnology

Volumn 13, Issue 4, 2002, Pages 510-514

  Chang, Win Jin ^a  

^a KUN SHAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BEAMS; SENSITIVITY ANALYSIS; STIFFNESS; SURFACES; VIBRATION MEASUREMENT;

ATOMIC FORCE MICROSCOPE; FLEXURAL VIBRATION MODE;

ATOMIC FORCE MICROSCOPY;

EID: 0036690076     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/13/4/314     Document Type: Article

References (15)

1. Atomic force microscope
2. Atomic force microscopy
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4. Vibrations of free and surface-coupled atomic force microscope cantilevers: Theory and experiment
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6. Contact stiffness of layered materials for ultrasonic atomic force microscopy
7. Sensitivity of flexural and torsional vibration modes of atomic force microscope cantilevers to surface stiffness variations
8. Atomic force microscopy lithography as a nanodevice development technique
9. Normal and lateral modulation with a scanning force microscope, an analysis: Implication in quantitative elastic and friction imaging
10. Vibrational dynamics of force microscopy: Effect of tip dimensions