Mechanical properties of high-aspect-ratio atomic-force microscope tips

Applied Physics Letters

Volumn 80, Issue 24, 2002, Pages 4623-4625

  Janchen G ^a   Hoffmann, P ^a   Kriele, A ^b   Lorenz, H ^b   Kulik, A J ^a   Dietler, G ^c  

^a EPFL   (Switzerland)

^b UNIVERSITY OF MUNICH   (Germany)

^c UNIVERSITY OF LAUSANNE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FLEXURAL VIBRATIONS; HIGH ASPECT RATIO; SCANNING ELECTRON MICROSCOPE;

ASPECT RATIO; SCANNING ELECTRON MICROSCOPY; VIBRATIONS (MECHANICAL);

MECHANICAL PROPERTIES;

EID: 79956028352     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1485307     Document Type: Article

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