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Volumn 249, Issue 3-4, 2003, Pages 487-491

Influence of SiN buffer layer in GaN epilayers

Author keywords

A1. Growth models; A1. Nucleation; A3. Metalorganic chemical vapor deposition; B2. Semiconducting III V materials

Indexed keywords

DISLOCATIONS (CRYSTALS); GALLIUM NITRIDE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NUCLEATION; OPTICAL PROPERTIES; POROSITY; SILICON NITRIDE; X RAY DIFFRACTION ANALYSIS;

EID: 0037366574     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)02357-6     Document Type: Article
Times cited : (32)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.