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Volumn 249, Issue 3-4, 2003, Pages 487-491
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Influence of SiN buffer layer in GaN epilayers
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Author keywords
A1. Growth models; A1. Nucleation; A3. Metalorganic chemical vapor deposition; B2. Semiconducting III V materials
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Indexed keywords
DISLOCATIONS (CRYSTALS);
GALLIUM NITRIDE;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
NUCLEATION;
OPTICAL PROPERTIES;
POROSITY;
SILICON NITRIDE;
X RAY DIFFRACTION ANALYSIS;
GROWTH MODELS;
CRYSTAL GROWTH;
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EID: 0037366574
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(02)02357-6 Document Type: Article |
Times cited : (32)
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References (10)
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