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Volumn 1, Issue 2, 2000, Pages 135-137
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Integration of Atomic Force and Confocal Microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000747447
PISSN: 14385163
EISSN: None
Source Type: Journal
DOI: 10.1002/1438-5171(200006)1:2<135::AID-SIMO135>3.0.CO;2-S Document Type: Article |
Times cited : (22)
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References (19)
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