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Volumn 47, Issue 2, 2003, Pages 247-251

Ambipolar Schottky barrier silicon-on-insulator metal-oxide-semiconductor transistors

Author keywords

Field induced drain; Negative differential conductance; Schottky barrier; Silicon on insulator

Indexed keywords

ELECTRIC POTENTIAL; ELECTRON TRAPS; LEAKAGE CURRENTS; PASSIVATION; SILICON ON INSULATOR TECHNOLOGY;

EID: 0037290262     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00202-2     Document Type: Conference Paper
Times cited : (17)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.